Program Contact: J. Steeds
(E0172) PS17.01.01
Session: II, Board: 335, Room: Not Yet Assigned
SIMULATION OF SYNCHROTRON WHITE BEAM TOPOGRAPHS: APPLICATION TO THE STUDY OF PIEZOELECTRIC DEVICES
Y. Epelboin , B. Capelle and J. Detaint
yves.epelboin@lmcp.jussieu.fr
(S0826) PS17.01.02
Session: II, Board: 336, Room: Not Yet Assigned
A NEW LIGHT MICROSCOPY TECHNIQUE FOR EXAMINING BIREFRINGENT MATERIALS
J.G. Lewis and A.M. Glazer
jlewis@jesus.ox.ac.uk
(E0884) PS17.01.03
Session: II, Board: 337, Room: Not Yet Assigned
X-RAY CHARACTERIZATION OF TEXTURE IN THIN FILMS USING A TWO DIMENSIONAL POSITION SENSITIVE DETECTOR
Peter D. Moran
pmoran@siemens-xray.com
(E0537) PS17.01.04
Session: II, Board: 338, Room: Not Yet Assigned
QUANTIFICATION OF STACKING FAULTS IN SYNDIOTACTIC POLYSTYRENE SINGLE CRYSTAL
Masatoshi Tosaka , Noritaka Hamada, Masaki Tsuji, Masahiro Fujita and Shinzo Kohjiya
tosaka@scl.kyoto-u.ac.jp
(E1462) PR17.01.05
DEVELOPMENT OF ROCKING CURVE METHOD FOR POLYCRYSTALLINE MATERIALS
S. Betsofen
sergmax@glas.apc.org
(E1461) PR17.01.06
X-RAY METHODS TO THE CHARACTERIZATION OF THIN COATINGS
S. Betsofen and L. Petrov
sergmax@glas.apc.org
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