Crystallographic Information Framework

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Index

Core dictionary (coreCIF) version 2.4.5

_refln_F_

Names:
'_refln_F_calc' '_refln_F_meas' '_refln_F_sigma'

Definition:

   The calculated, measured and standard uncertainty (derived from
   measurement) of the structure factors (in electrons for
   X-ray diffraction).

Appears in list containing _refln_index_

Type: numb

Category: refln


International Tables for Crystallography

Volume G: Definition and exchange of crystallographic data

First online edition (2006)

Edited by S. R. Hall and B. McMahon

An essential guide and reference to CIF for programmers, data managers handling crystal-structure information and practising crystallographers.